The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Mar. 25, 2016
Boe Technology Group Co., Ltd., Beijing, CN;
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Yanchen Li, Beijing, CN;
Panhua Wang, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
Embodiments of the invention provide display substrate, method for testing the same and display apparatus. The display substrate includes pixel regions arranged in matrix and test unit, each pixel region being provided with first electrode, wherein the test unit includes at least two test sub-units; first electrodes provided in adjacent pixel regions correspond to electrode block, and electrode blocks are electrically isolated from each other and divided, in accordance with their positions, into at least two test groups whose number is the same as that of the test sub-units; the electrode blocks of a same test group are provided spaced apart from each other in both row and column directions, and all the electrode blocks in the same test group are connected to one test sub-unit. The test unit can accurately test open or short defect existing in the display substrate, thereby improving test accuracy and lowering production costs.