The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Mar. 07, 2018
Applicant:

Government of the United States, As Represented BY the Secretary of the Air Force, Kirtland AFB, NM (US);

Inventors:

Casey J. Pellizzari, Prattville, AL (US);

Mark F. Spencer, Albuquerque, NM (US);

Charles A. Bouman, Jr., West Lafayette, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/04 (2006.01); G03H 1/08 (2006.01); G03H 1/22 (2006.01); G03H 1/32 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0443 (2013.01); G03H 1/0866 (2013.01); G03H 1/2202 (2013.01); G03H 1/32 (2013.01); G03H 2001/0452 (2013.01); G03H 2001/2247 (2013.01);
Abstract

Light reflected from an illuminated object is mixed with a reference beam and sensed at a sensor array of a digital hologram apparatus. Digital hologram data, determined from the sensed light, is dependent upon complex valued reflection coefficients of the object and upon phase perturbations in propagation paths between the object and the sensor array. Reflectance values, which may be dependent upon expected values of the absolute square of the reflection coefficients, and phase perturbations are determined for which a test function is at an extremum, where the test function contains a data fidelity term dependent upon the hologram data from a single hologram, a first regularization term dependent upon the phase perturbations and a second regularization term dependent upon the reflectance values. An image of the object may be formed from the reflectance values and a wavefront of the reflected light may be determined from the phase perturbations.


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