The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Feb. 11, 2019
Applicant:
Deutsches Krebsforschungszentrum, Heidelberg, DE;
Inventor:
Johann Engelhardt, Bad Schoenborn, DE;
Assignee:
DEUTSCHES KREBSFORSCHUNGSZENTRUM, Heidelberg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G01B 11/14 (2006.01); G02B 7/28 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/245 (2013.01); G01B 11/002 (2013.01); G01B 11/14 (2013.01); G02B 7/28 (2013.01);
Abstract
In a method of monitoring a relative position of a microscope objective with regard to a sample a test beam of light is directed onto at least one at least partially reflective surface connected to the sample, and light of the test beam reflected at the at least one at least partially reflective surface is registered and evaluated. Additionally, the test beam is directed onto a reflective surface of the microscope objective facing the sample, and light of the test beam reflected at the reflective surface of the microscope objective is also registered and evaluated.