The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Jul. 13, 2012
Applicants:

Shanjun LI, Katy, TX (US);

Dagang Wu, Katy, TX (US);

Luis E. San Martin, Houston, TX (US);

Yumei Tang, Tomball, TX (US);

Inventors:

Shanjun Li, Katy, TX (US);

Dagang Wu, Katy, TX (US);

Luis E. San Martin, Houston, TX (US);

Yumei Tang, Tomball, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/28 (2006.01); G01V 3/18 (2006.01); G01V 3/38 (2006.01); E21B 49/00 (2006.01); G01V 3/34 (2006.01);
U.S. Cl.
CPC ...
G01V 3/28 (2013.01); E21B 49/00 (2013.01); G01V 3/18 (2013.01); G01V 3/34 (2013.01); G01V 3/38 (2013.01);
Abstract

Improved algorithm for estimating anisotropic formation resistivity profile using a multi-component induction tool are disclosed. A method for estimating anisotropic formation resistivity profile of a formation comprises obtaining borehole corrected log data and determining at an azimuth angle of the formation. One or more formation bed boundaries are located and initial formation properties are calculated. One of a plurality of inversion windows is sequentially selected and a one-dimensional inversion of each of the sequentially selected one of the plurality of inversion windows is performed.


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