The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Mar. 16, 2016
Applicants:

Volkan Akcelik, Spring, TX (US);

Jerome R. Krebs, Houston, TX (US);

Inventors:

Volkan Akcelik, Spring, TX (US);

Jerome R. Krebs, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G01V 1/40 (2006.01); G01V 3/18 (2006.01); G01V 5/04 (2006.01); G01V 9/00 (2006.01); G01N 15/08 (2006.01); G01V 1/28 (2006.01); G01V 1/38 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/282 (2013.01); G01V 1/28 (2013.01); G01V 1/38 (2013.01); G01V 1/301 (2013.01); G01V 1/306 (2013.01); G01V 2210/32 (2013.01); G01V 2210/56 (2013.01); G01V 2210/614 (2013.01);
Abstract

A method, including: storing, in a computer storage device, geophysical seismic data that has been separated into a multiple-free component and a multiple contaminated component; performing, with a processor, a first full wavefield inversion process on the multiple-free component of the seismic data, wherein a first subsurface physical property model is generated; determining, with a processor, an extended target reflectivity, wherein the extended target reflectivity includes a reflectivity for each of a plurality of shots; separately performing, with a processor, a second full wavefield inversion process with the multiple contaminated component of the seismic data for each of the plurality of shots using the reflectivity corresponding to each of the plurality of shots, wherein a second subsurface physical property model is generated; and generating, with a processor, multiple-free final subsurface physical property model by combining the first subsurface physical property model and the second subsurface physical property model.


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