The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Oct. 24, 2016
Applicant:

Xia Llc, Hayward, CA (US);

Inventor:

William K. Warburton, Oakland, CA (US);

Assignee:

XIA LLC, Hayward, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/17 (2006.01); G01R 29/02 (2006.01); G04F 10/00 (2006.01); G01S 7/486 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4865 (2013.01); G01R 29/02 (2013.01); G01T 1/17 (2013.01); G04F 10/00 (2013.01);
Abstract

A digital processing technique for measuring the time of arrival of a digitized electronic signal pulse for in-line implementation in a field programmable gate array or digital signal processor. For each detected pulse, an interpolation method is used to estimate its maximum M, M is multiplied by a fraction f, and a second interpolation method is used to estimate the time when the pulse reaches the value f·M, which is then taken as the pulse's time of arrival. Various interpolation methods may be used. A particularly accurate method employs convolution of the pulse data by a kernel that is the product of the sinc function and a Gaussian. Detector physics limited time resolutions of 2-5% of the sampling interval are demonstrated. Estimating M is useful in its own right for determining pulse amplitudes, for example as a measure of the energies of photons absorbed in a detector.


Find Patent Forward Citations

Loading…