The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Mar. 26, 2018
Topcon Corporation, Itabashi-ku, Tokyo, JP;
Hideki Morita, Itabashi-ku, Tokyo, JP;
Ken'ichiro Yoshino, Itabashi-ku, Tokyo, JP;
Yasushi Tanaka, Itabashi-ku, Tokyo, JP;
TOPCON CORPORATION, Itabashi-ku, Tokyo, JP;
Abstract
A three-dimensional measurement device includes a light source unit that emits distance measurement light, a projection light optical system that causes the distance measurement light, emitted by the light source unit, to be emitted along a distance measurement light axis, a light receiving optical unit that receives the reflected distance measurement light, a light receiving and splitting unit that splits the reflected distance measurement light that has transmitted through the light receiving optical unit into first reflected split light and second reflected split light, attenuates intensity of the second reflected split light to be lower than intensity of the first reflected split light, and converts the first reflected split light and the second reflected split light into electrical signals, and angle detection units that detect a light emitting direction of the distance measurement light.