The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Feb. 03, 2017
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, Tokyo, JP;

Inventors:

Masanori Kurimoto, Tokyo, JP;

Yuki Iwagami, Tokyo, JP;

Yoshitake Nishiuma, Tokyo, JP;

Takayuki Yanai, Tokyo, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3187 (2006.01); G01R 31/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/007 (2013.01); G01R 31/2884 (2013.01);
Abstract

Even when parts having individual differences among identical parts or differences in deterioration speed between parts, or a part that does not have a non-volatile memory such as an EEPROM in a chip of the part itself, are mixed, there is no deterioration diagnosis device that can appropriately diagnose a state of deterioration due to temporal change or the like, because of which a mechanism (correction methodology) for evaluating and correcting deterioration in the precision or performance of an electronic part that has low precision or considerable temporal deterioration, and does not have a correction function, is incorporated in a deterioration diagnosis device, and a deterioration state is diagnosed using incorporated deterioration determination means when using a product after shipping.


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