The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Oct. 15, 2015
Applicant:
Ecole Superieure DE Physique ET DE Chimie Industrielles DE LA Ville DE Paris, Paris, FR;
Inventors:
Andrew David Griffiths, Paris, FR;
Raphaël Clément Li-Ming Doineau, Paris, FR;
Clément Nizak, Paris, FR;
Philippe Chi-Thanh Nghe, Saint-Mande, FR;
Jean Marie Pierre Baudry, Paris, FR;
Elodie Michéle Christine Brient-Litzler, Versailles, FR;
Alexei Godina, Asnieres-sur-Seine, FR;
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 33/68 (2006.01); G01N 15/00 (2006.01); B01L 3/00 (2006.01); C12Q 1/6844 (2018.01); C12Q 1/68 (2018.01);
U.S. Cl.
CPC ...
G01N 33/68 (2013.01); B01L 3/502715 (2013.01); B01L 3/502761 (2013.01); B01L 3/502784 (2013.01); C12Q 1/6846 (2013.01); G01N 33/543 (2013.01); B01L 2200/0668 (2013.01); B01L 2200/0673 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0864 (2013.01); B01L 2400/0487 (2013.01); G01N 2015/003 (2013.01); G01N 2015/0092 (2013.01);
Abstract
The invention concerns a method of analyzing the content of drops, involving then following step: The method involves a step in which a physical parameter characteristic of the attachment of the target element to the aggregate () is measured.