The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Feb. 29, 2016
Kyocera Corporation, Kyoto, JP;
Hiroshi Katta, Kashihara, JP;
KYOCERA CORPORATION, Kyoto, JP;
Abstract
A measurement method of a specimen liquid includes preparing a sensor chip comprising a reference SAW element and a detection SAW element have a relationship of an expression: t·V<L, where t, V and L denote is as defined in the specification; causing the specimen liquid to flow in order from either one of the reference SAW element and the detection SAW element: calculating a change with time of a phase difference Δθ between a phase θref in the reference SAW element and a phase θtest in the detection SAW element; and measuring a detection target from a starting point which is a point in time at an extreme value or later in the change with time of the phase difference Δθ.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile