The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Jul. 12, 2017
Applicant:

Center for Pharmaceutical Cleaning Innovation Corp., Hillsborough, NJ (US);

Inventors:

Andrew Walsh, Somerville, NJ (US);

Xi Wang, West Lebanon, NH (US);

Nick Downey, Catonsville, MD (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 21/94 (2006.01); G06T 7/00 (2017.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G06T 7/001 (2013.01); G06T 7/337 (2017.01);
Abstract

This disclosure describes a system and method for documenting and/or quantifying the inspection of the cleanliness of a surface. The documenting is attained through the capture of an image of the surface and uploading said image along with metadata about the image to a place of secure storage such as a company internal server or a web server. The quantification is attained through image analysis of the image, with or without enhancements such as UV light, to derive a value for the amount of residue remaining on the surface. This quantification can be performed on a device and sent to a server, or performed on the server itself after the image has been sent. In all cases, the inspection of cleanliness is documented with or without quantification.


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