The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Feb. 08, 2016
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Tetsuya Nagai, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4133 (2013.01);
Abstract

A first data acquisition processing unit acquires light intensity distribution data on the basis of an image of measurement light that has entered a camera. A second data acquisition processing unit acquires light intensity distribution data on the basis of the detected intensity of measurement light detected by a detector. A refractive index measurement processing unit measures the refractive index of a sample on the basis of the light intensity distribution data acquired by the second data acquisition processing unit. A determination processing unit determines whether the refractive index of the sample measured by the refractive index measurement processing unit is acceptable on the basis of the peaks of the light intensity distribution data acquired by the first data acquisition processing unit and second data acquisition processing unit.


Find Patent Forward Citations

Nagai, Tetsuya. (2019). V-block refractometer (U.S. Patent No. 10416077). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10416077

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