The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Mar. 18, 2016
Applicant:

Essilor International (Compagnie Generale D'optique), Charenton-le-Pont, FR;

Inventors:

Ahmed Haddadi, Charenton-Lepont, FR;

Melanie Tessieres, Charenton-Lepont, FR;

Assignee:

ESSILOR INTERNATIONAL, Charenton-le-Pont, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/33 (2006.01); G01N 21/55 (2014.01); G02C 7/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/33 (2013.01); G01N 21/55 (2013.01); G02C 7/027 (2013.01); G02C 7/028 (2013.01);
Abstract

Disclosed is a method for evaluating an index of exposure to ultraviolet radiation of an eye of a wearer equipped with spectacles including at least one eyeglass, including the following steps: —determining the area of a portion of the back face of the eyeglass, which portion is directly exposed to exterior radiation when the wearer is wearing the spectacles; —determining a value representative of the exposure to ultraviolet radiation of at least one environment frequented by the wearer; and —determining the index of exposure depending on the determined area and the determined value. An associated system is also described.


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