The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Jul. 31, 2014
Compagnie Generale Des Etablissements Michelin, Clermont-Ferrand, FR;
Michelin Recherche ET Technique S.a., Granges-Paccot, CH;
William David Mawby, Greenville, SC (US);
William David Mawby, Greenville, SC (US);
COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN, Clermont-Ferrand, FR;
Abstract
Methods and systems for improving the uniformity of a tire are provided. More particularly, a magnitude of a uniformity parameter can be obtained for each tire in a set of a plurality of tires. The magnitudes associated with the set of tires can be transformed according to a probability distribution function (e.g. a Weibull distribution function) to obtain a set of transformed magnitudes. Parameters associated with a probability distribution function can be estimated based at least in part on the transformed magnitudes. Parameters associated with the probability distribution function can be used to determine data indicative of a measurement error in the uniformity measurements attributable to a measurement process harmonic. The data indicative of the measurement error can be used to correct uniformity measurements obtained for tires and to modify tire manufacture based at least in part on the corrected measurements.