The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Jul. 28, 2016
Essilor International (Compagnie Generale D'optique), Charenton-le-pont, FR;
Cedric Lemaire, Charenton-le-Pont, FR;
Xavier Lippens, Charenton-le-Pont, FR;
ESSILOR INTERNATIONAL, Charenton-le-Pont, FR;
Abstract
Disclosed is a method for checking at least one geometric characteristic and one optical characteristic of a trimmed ophthalmic lens () including the following steps: a) arranging the trimmed ophthalmic lens on a support (), b) capturing at least one image of the trimmed ophthalmic lens, c) determining, from the image, a measured geometric characteristic of the trimmed ophthalmic lens, d) determining at least one measured optical characteristic of the trimmed ophthalmic lens in a reference frame of the image captured in step b), e) comparing the measured geometric characteristic associated with the measured optical characteristic to a predefined desired ophthalmic lens model, including at least one desired geometric characteristic and one associated desired optical characteristic. Also disclosed is an associated checking device.