The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Jul. 07, 2017
Applicant:
Invensense, Inc., San Jose, CA (US);
Inventors:
Ozan Anac, Sunnyvale, CA (US);
Joseph Seeger, Menlo Park, CA (US);
Assignee:
INVENSENSE, INC., San Jose, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01C 25/00 (2006.01); G01C 19/56 (2012.01); G01C 19/574 (2012.01); G01C 19/5712 (2012.01);
U.S. Cl.
CPC ...
G01C 25/00 (2013.01); G01C 19/56 (2013.01); G01C 19/574 (2013.01); G01C 19/5712 (2013.01); G01C 25/005 (2013.01);
Abstract
A self-test method by rotating the proof mass at a high frequency enables testing the functionality of both the drive and sense systems at the same time. In this method, the proof mass is rotated at a drive frequency. An input force which is substantially two times the drive frequency is applied to the actuation structures to rotate the proof mass of the gyroscope around the sensitive axis orthogonal to the drive axis. An output response of the gyroscope at the drive frequency is detected by a circuitry and a self-test response is obtained.