The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Jun. 09, 2017
Applicant:

Keyence Corporation, Osaka, JP;

Inventor:

Takashi Nakatsukasa, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G06T 7/70 (2017.01); G01B 11/08 (2006.01); G06T 7/521 (2017.01); G06T 7/40 (2017.01); G06T 7/55 (2017.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); G01B 11/08 (2013.01); G06T 7/40 (2013.01); G06T 7/521 (2017.01); G06T 7/70 (2017.01); G06T 7/55 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30164 (2013.01); H04N 5/247 (2013.01);
Abstract

Provided is a measuring device that can easily and accurately measure a shape at a desired point of a measuring object. A stage is held on an installation part. A head unit including a light projecting unit and a light receiving unit and the installation part are fixedly coupled together by a stand. An effective region is set to a space on the stage. Point cloud data corresponding to the effective region is obtained as measurement data from the generated point cloud data. Designation of a point to be measured in the measuring object is received, and a measurement value at the designated point is calculated based on the obtained measurement data.


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