The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Nov. 10, 2017
Applicant:

Keyence Corporation, Osaka, JP;

Inventor:

Yuji Akishiba, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0608 (2013.01);
Abstract

To provide an optical-scanning-height measuring device capable of reducing an unmeasurable region on the surface of a measurement object. Light emitted from a light emitting section is deflected by a deflecting section according to designation of a measurement point. Measurement light is sequentially irradiated on a plurality of portions P in a partial region PA including or surrounding a part of a measurement object S corresponding to the measurement point. A deflecting direction of the deflecting section corresponding to the partial region PA or an irradiation position of the measurement light corresponding to the partial region PA are detected by a detecting section.


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