The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Aug. 17, 2017
Applicant:
Bridger Photonics, Inc., Bozeman, MT (US);
Inventors:
Michael Thorpe, Bozeman, MT (US);
Aaron Kreitinger, Bozeman, MT (US);
Randy Reibel, Bozeman, MT (US);
Assignee:
Bridger Photonics, Inc., Bozeman, MT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/02 (2006.01); H04B 10/071 (2013.01); H04B 10/079 (2013.01); H04B 10/516 (2013.01);
U.S. Cl.
CPC ...
G01B 9/02007 (2013.01); G01B 9/02004 (2013.01); G01B 9/02075 (2013.01); G01B 11/026 (2013.01); H04B 10/071 (2013.01); H04B 10/07953 (2013.01); H04B 10/5165 (2013.01);
Abstract
Length metrology apparatuses and methods are disclosed for measuring both specular and non-specular surfaces with high accuracy and precision, and with suppressed phase induced distance errors. In one embodiment, a system includes a laser source exhibiting a first and second laser outputs with optical frequencies that are modulated linearly over large frequency ranges. The system further includes calibration and signal processing portions configured to determine a calibrated distance to at least one sample.