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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10415118 B1

PDFFull Text
Date of Patent:
Sep. 17, 2019

Filed:

Jun. 06, 2013

Aluminum alloy plate

Applicant:

Uacj Corporation, Tokyo, JP;

Inventors:

Yusuke Yamamoto, Tokyo, JP;

Mineo Asano, Tokyo, JP;

Assignee:

UACJ Corporation, Tokyo, JP;

Attorney:

Westman, Champlin & Koehler, P.A.

Primary Examiner:

Brian D Walck

Int. Cl.
CPC ...
C22C 21/06 (2006.01); C22C 21/00 (2006.01); C22C 21/08 (2006.01); B22D 21/04 (2006.01); C22F 1/00 (2006.01); C22F 1/04 (2006.01); B62D 29/00 (2006.01); H05K 5/04 (2006.01); B22D 27/02 (2006.01);
U.S. Cl.
CPC ...
C22C 21/06 (2013.01); B22D 21/04 (2013.01); B62D 29/008 (2013.01); C22C 21/00 (2013.01); C22C 21/08 (2013.01); C22F 1/00 (2013.01); C22F 1/04 (2013.01); H05K 5/04 (2013.01); B22D 27/02 (2013.01);
Abstract

An aluminum alloy plate includes peritectic elements and Mg. Wherein plate thickness of the plate is represented as t (mm), a range within ±0.01×t from t/2 is represented as a central portion, a range within ±0.01×t from t/4 is represented as a quarter portion, and a range within 0.02×t from a top surface in the plate thickness direction is represented as a superficial portion, concentration of the peritectic elements is such that a concentration difference between in the central portion and in the quarter portion, and a concentration difference between in the central portion and in the superficial portion are 0.04% (mass %) or less. In addition, concentration of the Mg is such that a concentration difference between in the central portion and in the quarter portion, and a concentration difference between in the central portion and in the superficial portion of the plate thickness are 0.4% or less.

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