The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Mar. 03, 2017
Applicant:

Applied Biosystems, Llc, Carlsbad, CA (US);

Inventors:

Hongye Sun, Belmont, CA (US);

Steven Fung, Palo Alto, CA (US);

Sam Lee Woo, Redwood City, CA (US);

Assignee:

APPLIED BIOSYSTEMS, LLC, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/30 (2006.01); C12Q 1/6874 (2018.01); C12Q 1/6811 (2018.01); C12Q 1/6869 (2018.01); G01N 27/327 (2006.01); C12Q 1/68 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6874 (2013.01); C12Q 1/6811 (2013.01); C12Q 1/6869 (2013.01); G01N 27/3276 (2013.01); G01N 27/3278 (2013.01); Y10T 436/14 (2015.01); Y10T 436/142222 (2015.01); Y10T 436/143333 (2015.01);
Abstract

A method for sequencing a nucleic acid template includes forming a nanowire assembly including a semiconductor nanowire and a probe covalently bound to the semiconductor nanowire; contacting the nanowire assembly with a template nucleic acid; contacting the nucleic acid duplexes with an extension nucleic acid, the extension nucleic acid joined to the probe; disrupting the nucleic acid duplexes; and measuring an electrical characteristic of a nanowire assembly of the set of nanowire assemblies.


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