The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Jun. 08, 2016
The General Hospital Corporation, Boston, MA (US);
Seok-Hyun Yun, Cambridge, MA (US);
Johannes F. De Boer, Amstelveen, NL;
The General Hospital Corporation, Boson, MA (US);
Abstract
Exemplary apparatus, arrangement and method can be provided for obtaining information associated with an anatomical structure or a sample using optical microscopy. For example, a light radiation can be separated into first light radiation(s) directed to an anatomical sample and second light radiation directed to a reference. A wavelength of the radiation can vary over time, and the wavelength can be shorter than approximately 1150 nm. An interference can be detected between third and fourth radiations associated with the first and second radiations and fourth radiation, respectively. At least one image corresponding to portion(s) of the sample can be generated using data associated with the interference. In addition, source(s) can be provided which can be configured to provide an electromagnetic radiation having a wavelength that varies over time. A period of a variation of the wavelength of the first electromagnetic radiation(s) can be shorter than 1 millisecond, and the wavelength can be shorter than approximately 1150 nm.