The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Jul. 27, 2017
Qualcomm Incorporated, San Diego, CA (US);
Htet Naing, San Diego, CA (US);
Kalin Mitkov Atanassov, San Diego, CA (US);
Albrecht Johannes Lindner, La Jolla, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods, systems, and apparatuses are provided to compensate for a misalignment of optical devices within an imaging system. For example, the methods receive image data captured by a first optical device having a first optical axis and a second optical device having a second optical axis. The methods also receive sensor data indicative of a deflection of a substrate that supports the first and second optical devices. The deflection can result from a misalignment of the first optical axis relative to the second optical axis. The methods generate a depth value based on the captured image data and the sensor data. The depth value can reflect a compensation for the misalignment of the first optical axis relative to the second optical axis.