The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Mar. 28, 2016
Applicant:

Abb Technology Ag, Zurich, CH;

Inventors:

Andrea Botarelli, Terranuova Bracciolini, IT;

Davide Tazzari, Loro Ciuffenna, IT;

Filippo Ceccherini, Terranuova Bracciolini, IT;

Filippo Vernia, La Spezia, IT;

Tito Cuccoli, Terranuova Bracciolini, IT;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); H04L 29/08 (2006.01); H04Q 9/04 (2006.01); G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
H04L 67/1095 (2013.01); G06F 17/40 (2013.01); H04L 67/125 (2013.01); H04Q 9/04 (2013.01); H04Q 2209/753 (2013.01); Y04S 40/18 (2018.05);
Abstract

In a method for gathering time-variable data from electronic slave devices in data communication through a data transmission channel with an electronic master device, the slave devices periodically measure and store a current value of at least one respective time-variable parameter (P(t), . . . Pn(t)). The master device sends a freeze command to the slave devices. Upon receipt of the freeze command from the master device, the slave devices freeze the last measured value of the at least one time-variable parameter. During a data-gathering time interval following sending of the freeze command, the master device gathers the frozen values from the slave devices.


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