The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Mar. 10, 2014
Applicant:

Novelis Inc., Atlanta, GA (US);

Inventors:

Leslie Calvin Hildenbrandt, Windsor, CO (US);

Gary Thornton, Fort Collins, CO (US);

Assignee:

Novelis Inc., Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/125 (2006.01); G01N 27/416 (2006.01); G01N 33/205 (2019.01);
U.S. Cl.
CPC ...
H03K 5/125 (2013.01); G01N 27/4161 (2013.01); G01N 33/205 (2019.01);
Abstract

Methods and apparatus for measuring the cleanliness of molten metal. Direct current is passed through molten metal advancing through a passage. A voltage signal is analyzed for the presence of solid generally non-metallic inclusions in the metal. A method includes sampling digital data of the voltage signal to generate data samples; updating a delayed running average of the data samples to establish a baseline for identifying sudden changes in amplitude of the data samples; determining a threshold by adding a prescribed value to the baseline; identifying a possible inclusion when a significant number of data samples exceeds the threshold; storing a maximum count as the data samples using peak detection until a prescribed number of the data samples fall below the threshold; and comparing a parameter of the possible inclusion with a lookup table to categorize the possible inclusion as either (i) an actual inclusion or (ii) noise.


Find Patent Forward Citations

Loading…