The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Jan. 24, 2018
Applicant:

Sanken Electric Co., Ltd., Saitama, JP;

Inventors:

Hiroshi Shikauchi, Saitama, JP;

Tomonori Hotate, Saitama, JP;

Yuki Tanaka, Saitama, JP;

Shinji Kudoh, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/78 (2006.01); H01L 23/00 (2006.01); H01L 29/16 (2006.01); H01L 23/528 (2006.01); H01L 21/762 (2006.01); H01L 21/304 (2006.01); H01L 21/683 (2006.01); H01L 29/06 (2006.01);
U.S. Cl.
CPC ...
H01L 23/562 (2013.01); H01L 21/304 (2013.01); H01L 21/6836 (2013.01); H01L 21/76224 (2013.01); H01L 21/78 (2013.01); H01L 23/528 (2013.01); H01L 29/0649 (2013.01); H01L 29/16 (2013.01); H01L 29/1608 (2013.01);
Abstract

A semiconductor wafer and a method for forming a semiconductor. The semiconductor wafer includes: a first semiconductor component having a first device; a second semiconductor component having a second device; an insulation layer laterally extending to the first semiconductor component and the second semiconductor component; and a grind layer configured on or adjacent to a backside of the semiconductor wafer. Therefore, chipping or cracking can be decreased or avoided when the grind layer is exposed during the thinning process (such as backside grinding).


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