The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

May. 21, 2018
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Tomer Tzvi Eliash, Kfar Saba, IL;

Arthur Shulkin, Yavne, IL;

James Yin Tom, Tel Aviv, IL;

Eran Sharon, Rishon Lezion, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/10 (2006.01); G11C 16/22 (2006.01); G11C 16/34 (2006.01); G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3495 (2013.01); G11C 16/10 (2013.01); G11C 16/22 (2013.01); G11C 16/3459 (2013.01); G11C 29/70 (2013.01); G11C 2216/16 (2013.01);
Abstract

Systems and methods are described for predicting potential failures in flash memory devices by probing for memory cells with marginal programming characteristics. A method includes receiving a write request. The method also includes applying a predetermined number of programming pulses to a plurality of memory cells within a block of a flash memory device. The method also includes applying a verify pulse to each respective one of the plurality of memory cells. The method also includes storing programming status of the plurality of memory cells into a set of latches. The method also includes determining, based on the stored programming status, a total number of memory cells within the block that fall outside of one or more predetermined expected ranges. The method also includes identifying the block as a block in risk when the total number of memory cells satisfies a predetermined risk threshold.


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