The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Mar. 23, 2015
Applicant:

University of Iowa Research Foundation, Iowa City, IA (US);

Inventors:

Michael D. Abramoff, Iowa City, IA (US);

Li Tang, Iowa City, IA (US);

Xiaodong Wu, Coralville, IA (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 7/162 (2017.01);
U.S. Cl.
CPC ...
G06T 7/162 (2017.01); G06T 7/11 (2017.01); G06T 2207/10081 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/20072 (2013.01); G06T 2207/20112 (2013.01); G06T 2207/30101 (2013.01);
Abstract

Disclosed are methods and systems for analyzing data. An example method can comprise receiving volume data representative of an object. A first graph can be generated based on the volume data. The first graph can comprise nodes arranged in a Euclidean space. A deformation field can be determined based on the volume data. The deformation field can be applied to the first graph to form a second graph. The second graph can comprise nodes arranged in a non-Euclidean space. The second graph can be segmented.


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