The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Aug. 10, 2017
International Business Machines Corporation, Armonk, NY (US);
Conrad M. Albrecht, White Plains, NY (US);
Marcus O. Freitag, Sleepy Hollow, NY (US);
Hendrik F. Hamann, Yorktown Heights, NY (US);
Sharathchandra U. Pankanti, Darien, CT (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A computer-implemented method includes receiving one or more training images depicting one or more training geographical regions. One or more environmental characteristic (EC) values are determined for the training images. The EC values include at least one EC value for each of the training images. One or more models are generated for mapping an EC value of an image to a determination of whether an artifact is present in a geographical region depicted by the image, based on the EC values and based on knowledge of which of the training images depict training geographical regions having artifacts present. A new image is received depicting a new geographical region. The models are applied to the new image. A probability that a new artifact is present in the new geographical region depicted in the new image is determined, based on the applying the models to the new image.