The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Mar. 01, 2017
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Vivian G. Kammler, Albuquerque, NM (US);
Robert C. Armstrong, Dublin, CA (US);
Andrew Michael Smith, Davis, CA (US);
Jackson R. Mayo, Livermore, CA (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
Described herein are various technologies for metrics-based assessment and trust verification of netlists for hardware logic devices (e.g., ASICs, FPGAs, etc.). A computing system translates a netlist of a hardware logic device into a Boolean network. The computing system generates and assigns metrics to edges of the Boolean network. The metrics comprise a coverage metric, a rare trigger metric, and an influence metric. Based upon the metrics, the computing system assigns the nodes in the Boolean network criticality values. The computing system determines a likelihood of a vulnerability in the netlist based upon the criticality values. The computing can output an indication as to whether the netlist is trusted based upon the determined likelihood of a vulnerability in the netlist.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile