The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Jan. 23, 2017
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Larissa Heissler, Mühlhausen, DE;

Andre Adam, Walldorf, DE;

Philipp Mail, Waghäusel, DE;

Florian Hoffmann, Oftersheim, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01);
Abstract

Systems and methods are provided herein for multi-pass duplicate identification using sorted neighborhoods. Data comprising a plurality of data records is received. Neighborhood records are generated by merging the plurality of data records with reference records stored in a remote data store. A resource identification field is assigned to each reference record. A pair distance, for each pair of neighborhood records having different resource identification fields, is determined by calculating a standard deviation of distances between each attribute of the pair scaled by a filled pairs quote value. Possible duplicate records are identified by evaluating each pair distance against a threshold, each possible duplicate having grouped attributes. Final duplicate records are identified by matching each group to a key.


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