The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Aug. 15, 2016
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Anirudh Balachandra Aithal, Seattle, WA (US);

Michael David Marr, Monroe, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/177 (2006.01); G06F 11/263 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G06F 11/2205 (2013.01);
Abstract

Systems and methods are described for testing computing resources. In one embodiment, a search space of computing settings is analyzed in accordance with weighted data that maps computing performance parameters with the computing settings. A subset of the computing settings is selected to generate a test population to optimize at least one computing performance parameter. One or more computing devices in a computing environment are configured in accordance with the test population, and the test conditions are iteratively updated based on test results in accordance with the test population and a fitness function.


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