The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Jul. 27, 2017
International Business Machines Corporation, Armonk, NY (US);
Bartlomiej Malecki, Slomniki, PL;
Piotr Padkowski, Lodz, PL;
Marek Peszt, Kraków, PL;
Piotr Józef Walczak, Kraków, PL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, a computer system, and a computer program product for clustering operational parameter values in a micro-service architecture used in a computing infrastructure. The computer system measures a plurality of operational parameter values of elements of the computing infrastructure and logs identifiers for elements having caused a problem situation and related problem resolution times. The computer system clusters the operational parameter values of the elements having caused the problem situation, according to a correlation function. The computer system orders the operational parameter values within a cluster and the elements having caused the problem situation. The computer system periodically performs the clustering and the ordering such that a sequence of the operational parameter values and the elements having caused the problem situation is indicative of a resolution time required for a new problem situation.