The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Jul. 31, 2017
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Ken Kim, Worcester, MA (US);

Muzhar Khokhar, Shrewsbury, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 1/20 (2006.01); G06T 1/60 (2006.01); G06F 3/14 (2006.01); G09G 5/36 (2006.01); G06F 3/06 (2006.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0619 (2013.01); G06F 3/0683 (2013.01); G06T 1/60 (2013.01); G06T 19/006 (2013.01);
Abstract

Wear-related information is obtained from one or more storage devices in a storage array system being monitored. One or more graphics representing at least a portion of the wear-related information are generated. The one or more graphics are overlaid onto a real-world view of the one or more storage devices of the storage array system being monitored to generate an augmented reality view illustrating the wear-related information for the one or more storage devices of the storage array system being monitored. The augmented reality view may be presented on a user device. In one example, the wear-related information comprises estimated EOL computations for each of the one or more storage devices.


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