The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

May. 27, 2015
Applicant:

Agc Inc., Tokyo, JP;

Inventors:

Akihiko Yoshihara, Tokyo, JP;

Takaaki Murakami, Tokyo, JP;

Assignee:

AGC Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/28 (2006.01); G02B 5/26 (2006.01); G03B 11/00 (2006.01); H01L 31/0216 (2014.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
G02B 5/282 (2013.01); G02B 5/26 (2013.01); G03B 11/00 (2013.01); H01L 31/02165 (2013.01); H01L 27/14621 (2013.01);
Abstract

A near-infrared cut filter has a transparent substrate and an optical multilayer film formed on the transparent substrate and including high-refractive index films each having a refractive index at a wavelength of 500 nm in a range of 2.0 to 2.8 and low-refractive index films each having a refractive index at the wavelength of 500 nm of less than 1.6. The multilayer film is formed such that the high-refractive and low-refractive index films are alternately stacked and that the filter has spectral transmittance characteristic for the entire wavelength range of 450 nm to less than 550 nm and part of that wavelength range for incident light having incident angle of 0 degree, and part of wavelength range of 450 nm to less than 550 nm and the entire wavelength range of 450 nm to less than 550 nm for incident light having incident angle of 40 degrees.


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