The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Sep. 09, 2012
Applicants:

Peter T. Wu, Missouri City, TX (US);

Gong LI Wang, Sugar Land, TX (US);

Thomas D. Barber, Houston, TX (US);

Charles A. Johnson, Katy, TX (US);

Inventors:

Peter T. Wu, Missouri City, TX (US);

Gong Li Wang, Sugar Land, TX (US);

Thomas D. Barber, Houston, TX (US);

Charles A. Johnson, Katy, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01); E21B 47/12 (2012.01); G01V 3/28 (2006.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01); E21B 47/121 (2013.01); E21B 47/124 (2013.01); G01V 3/28 (2013.01);
Abstract

A method for logging a formation or sample includes obtaining a plurality of multiaxial conductivity measurements from the formation or sample. A horizontal resistivity measurement, a dip measurement and a dip azimuth measurement are derived from the plurality of multiaxial conductivity measurements. A sharp vertical resistivity measurement is derived from a subset of the plurality of multiaxial conductivity measurements.


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