The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Jul. 22, 2015
Applicant:

Fairfield Industries Incorporated, Sugarland, TX (US);

Inventor:

William Aeppli Schneider, Jr., Sugar Land, TX (US);

Assignee:

Fairfield Industries Incorporated, Sugarland, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/34 (2006.01); G01V 1/36 (2006.01); G01V 1/32 (2006.01);
U.S. Cl.
CPC ...
G01V 1/306 (2013.01); G01V 1/301 (2013.01); G01V 1/325 (2013.01); G01V 1/34 (2013.01); G01V 1/36 (2013.01); G01V 2210/14 (2013.01); G01V 2210/51 (2013.01); G01V 2210/74 (2013.01);
Abstract

The present disclosure is directed to detecting subsurface features via a seismic survey. A system can obtain seismic data from nodes separated from each other by at least a threshold distance on a ground surface. The seismic data can include image trace data based on field trace data detected from each of the plurality of seismic data acquisition units. The system retrieves a sample interval and a parameter. The system configures a bandlimited binning function with the sampling interval and the predetermined parameter. The system applies the bandlimited binning function to a plurality of image traces of the image trace data to generate a bandlimited angle gather value for a bin in an angle gathers grid. The system generates an image based on the angle gathers grid and provides the image for display.


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