The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
May. 25, 2017
Applicant:
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Inventors:
Hyun Wook Park, Daejeon, KR;
Dong Chan Kim, Daejeon, KR;
Assignee:
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/385 (2006.01); G01R 33/387 (2006.01); G01R 33/48 (2006.01); G01R 33/483 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3852 (2013.01); G01R 33/387 (2013.01); G01R 33/482 (2013.01); G01R 33/4835 (2013.01);
Abstract
The present disclosure in some embodiments provides a method and an apparatus for processing MRI images wherein a plurality of slices of an object is applied with a spatial encoding gradient and a corrected gradient for applying a radial sampling, and radially sampled magnetic resonance signals of the slices are received, and MRI images are generated with the radial sampling applied over multi-bands.