The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Jul. 15, 2014
Hts-110 Limited, Gracefield, Lower Hutt, NZ;
Michael Graeme Fee, Wellington, NZ;
Oliver John Dickie, Wellington, NZ;
Scott Technology NZ Limited, Kenmure, Dunedin, NZ;
Abstract
A magnetic testing apparatus includes a magnet assembly with a sample path extending through the magnet assembly. The magnetic field produced by the magnet assembly defines a known, varying magnetic field profile along the sample path. A sample is moved along sample path such that the sample portion is subjected to a predetermined magnetic field ramp or magnetic field profile during a measurement period. A measurement arrangement is also provided to measure one or more properties of the sample during the measurement period, in order to test sample properties at a plurality of different magnetic fields. The apparatus may be particularly suited to magneto-optical measurements, including Magneto-Optical Kerr Effect measurements. The apparatus may be used for testing of hard disk platters.