The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Mar. 15, 2017
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Shinichi Taniguchi, Tokyo, JP;
Takahiro Ando, Tokyo, JP;
Assignee:
HITACHI, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 33/68 (2006.01); G01N 33/92 (2006.01); B01D 15/38 (2006.01); G01N 30/88 (2006.01); G01N 30/14 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54373 (2013.01); B01D 15/3852 (2013.01); G01N 30/14 (2013.01); G01N 30/88 (2013.01); G01N 33/54366 (2013.01); G01N 33/54386 (2013.01); G01N 33/6842 (2013.01); G01N 30/7233 (2013.01); G01N 33/6848 (2013.01); G01N 33/92 (2013.01); G01N 2030/143 (2013.01); G01N 2030/8822 (2013.01); G01N 2600/00 (2013.01); Y10T 436/255 (2015.01); Y10T 436/25125 (2015.01);
Abstract
A chemical analysis apparatus that quantitatively determines an object of detection rapidly with high sensitivity, and a pretreatment apparatus and a chemical analysis method used for the chemical analysis apparatus, are provided. The chemical analysis apparatus includes a pretreatment unit that accommodates a molecularly imprinted polymer capable of capturing a polar group-containing molecule included in a specimen. A quantification unit quantitatively determines a component included in the specimen that has been passed through the pretreatment unit.