The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Sep. 26, 2016
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Qingjun Zhang, Beijing, CN;
Yuanjing Li, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Ziran Zhao, Beijing, CN;
Weiping Zhu, Beijing, CN;
Yaohong Liu, Beijing, CN;
Qiufeng Ma, Beijing, CN;
Xiang Zou, Beijing, CN;
Huishao He, Beijing, CN;
Jianping Chang, Beijing, CN;
Song Liang, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
A darkroom type security inspection apparatus and a method of performing an inspection using the darkroom type security inspection apparatus. An apparatus includes a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing include: a sample collecting unit configured to collect a sample, a conveyor unit, and a X-ray detection unit to detect a position of the objected to be inspected, wherein the X-ray detection unit is configured to determine the position of the objected to be inspected within the sampling assembly so that the object to be inspected together with the conveyor unit is conveyed to an expected position; and a sample processing assembly, wherein the assemblies disposed inside the housing are communicated by fittings or connectors.