The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Apr. 05, 2017
Honeywell International Inc., Morris Plains, NJ (US);
Cenek Sandera, Brno, CZ;
HONEYWELL INTERNATIONAL INC., Morris Plains, NJ (US);
Abstract
Systems and methods are provided for detecting structural damage in a component. An ultrasonic guided wave (UGW) device scans the component along a monitoring path to generate a monitoring UGW measurement and along a reference path to generate a reference UGW measurement. A database has a plurality of database reference UGW measurements each corresponding to a database monitoring UGW measurement. A damage detection module searches the database for the database reference UGW measurement that matches the reference UGW measurement. When a match is found, the damage detection module obtains the database monitoring UGW measurement corresponding to the matched database reference UGW measurement, compares the monitoring UGW measurement with the database monitoring UGW measurement, and identifies damage to the component based on the comparison. When the match is not found, the damage detection module updates the database with the reference UGW measurement and the monitoring UGW measurement.