The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Apr. 25, 2018
Applicant:

National Cheng Kung University, Tainan, TW;

Inventor:

Sheng-Hao Tseng, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/47 (2006.01); G01N 21/31 (2006.01); A61B 5/00 (2006.01); A61B 5/1455 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4738 (2013.01); A61B 5/0059 (2013.01); G01N 21/31 (2013.01); G01N 21/4795 (2013.01); A61B 5/14556 (2013.01);
Abstract

A diffuse reflectance spectroscopy system for determining an optical property of a specimen and a method for operating the same are provided. The system includes: a light emitting unit comprising a light emitting terminal, the light emitting unit configured to emit steady light; an optical medium arranged at one end of the device, the optical medium being controllable to switch between multiple optical states and configured to deliver the steady light to the specimen through the optical medium in different optical states, wherein the optical medium comprises a first surface in contact with the light emitting terminal of the light emitting unit and a second surface for contact with the specimen; and a detecting module comprising one or more receiving terminals for receiving light scattered from the specimen for determining the optical property of the specimen.


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