The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Nov. 02, 2016
Murata Manufacturing Co., Ltd., Nagaokakyo-shi, Kyoto-fu, JP;
Takashi Kondo, Nagaokakyo, JP;
Seiji Kamba, Nagaokakyo, JP;
Naoki Kawara, Nagaokakyo, JP;
Takashi Shimizu, Nagaokakyo, JP;
MURATA MANUFACTURING CO., LTD., Nagaokakyo-Shi, Kyoto-Fu, JP;
Abstract
A measurement method measures an amount of substance of an analyte in a sample fluid passing through a perforated structure having a pair of principal surfaces opposed to each other and having a plurality of cavity portions extending through both of the principal surfaces. An elapsed time from a time when the sample fluid begins passing through the perforated structure or a predetermined time thereafter to a time when a characteristic value of the perforated structure reaches a predetermined threshold. The elapsed time is used to determine the amount (the concentration) of substance of the analyte.