The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Apr. 29, 2016
Applicant:

The European Union, Represented BY the European Commission, Brussels, BE;

Inventors:

Andrea Valsesia, Ranco, IT;

Cloé Desmet, St Nicolas de Macherin, FR;

Pascal Colpo, Angera, IT;

François Rossi, Bergen, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/00 (2006.01); G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0227 (2013.01); G01N 15/00 (2013.01); B01J 2219/00619 (2013.01); B01J 2219/00621 (2013.01); B01J 2219/00635 (2013.01); B01J 2219/00637 (2013.01); G01N 15/0205 (2013.01); G01N 2015/0038 (2013.01);
Abstract

A nanoparticle screening chip and a method using said chip allowing for determining physical properties of nanoparticles, wherein the screening chip comprises a substrate having a working surface divided into a plurality of areas, wherein (1) each of these areas presents different surface properties defined by surface energy component (d,b,a), the total free energy γof the surface of each area being defined as follows: γ=γ+2(γγ), wherein the components are: γ=dispersive component=d, γ=electron acceptor component=b, γ=electron donor component=a; and (2) each of these areas comprises a plurality of subareas, each subarea comprising an array of sub-micrometric holes or elongated grooves with a different aperture size (S, S, S, . . . ).


Find Patent Forward Citations

Loading…