The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Jun. 23, 2014
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventor:

Hirosuke Sugasawa, Kyoto, JP;

Assignee:

HORIBA, LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01);
Abstract

In order to reduce a calculation time of a particle size distribution, a particle size distribution measuring apparatus includes: a light source for irradiating light to particles to be measured; a plurality of photodetectors for detecting light intensities of diffracted/scattered lights caused by the irradiation of the light; and an operation part for receiving light intensity signals outputted from the respective photodetectors and calculating a particle size distribution of the particles based on the fact that a vector s is represented by a predetermined expression including a product of a vector q and a coefficient matrix K, and the operation part is configured to compute in parallel and calculate at least two elements of the elements of the coefficient matrix K.


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