The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Oct. 10, 2014
Kobe Steel, Ltd., Hyogo, JP;
Kaname Araki, Kobe, JP;
Eiji Takahashi, Kobe, JP;
Kobe Steel, Ltd., Hyogo, JP;
Abstract
A sample point extraction unit () extracts natural defect candidate portions by using sample points comprising height data for one line obtained by scanning once around the measurement surface of a tire surface. Natural defect candidate portions include natural defect portions and intentional irregularity portions, such as characters and patterns. A differentiation unit () stores, in advance, conditions characteristic of the shape of intentional irregularity portions formed on the measurement surface, and from among the natural defect candidate portions, excludes natural defect candidate portions that satisfy those conditions from the natural defect candidate portions. Due to this configuration, intentional irregularity portions are differentiated from natural defect portions.