The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Jul. 31, 2017
Ihi Corporation, Koto-ku, JP;
Hatsuo Mori, Tokyo, JP;
Noriyoshi Mizukoshi, Tokyo, JP;
Takashi Ogai, Tokyo, JP;
Yusuke Maru, Kanagawa, JP;
Takayuki Yamamoto, Kanagawa, JP;
Shinsuke Takeuchi, Kanagawa, JP;
Satoshi Nonaka, Kanagawa, JP;
Tsuyoshi Yagishita, Kanagawa, JP;
IHI Corporation, Koto-ku, JP;
Abstract
An abnormality diagnosing method includes a model generation step of generating a simulation model of a monitoring target, an operation start step of starting an operation of the monitoring target, a measurement step of measuring an internal state quantity in the operating state of the monitoring target and extracting a measured value, a prediction step of inputting into the simulation model same control input value used in the operating state of the monitoring target and calculating a predicted value of the internal state quantity of the monitoring target, a Mahalanobis distance calculation step of calculating a Mahalanobis distance from a difference between the measured value and the predicted value, and an abnormality diagnosis step of diagnosing whether the operating state of the monitoring target is abnormal based on the Mahalanobis distance.