The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Dec. 07, 2015
Applicants:

Universite DE Nantes, Nantes, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Inventors:

Sébastien Garnier, La Chapelle sur Erdre, FR;

Benoît Furet, Nantes, FR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/04 (2006.01); G01B 3/30 (2006.01); G01M 99/00 (2011.01); G01L 5/00 (2006.01);
U.S. Cl.
CPC ...
G01L 5/0038 (2013.01); G01B 3/30 (2013.01); G01B 21/042 (2013.01); G01M 99/007 (2013.01); G05B 2219/37101 (2013.01); G05B 2219/37343 (2013.01); G05B 2219/37619 (2013.01); G05B 2219/39034 (2013.01);
Abstract

A device for measuring a path under load of a first part that is in motion relative to a second part. The device includes an active telescopic bar and a connector. The telescopic bar includes a scale to measure the length of the bar, a coupler to ball link at each end of the bar, and a force sensor to measure the force applied to the bar along its longitudinal axis. The connector links each end of the bar to the first and second part, respectively. The spatial components of the force applied to one of the connector are measured. A measuring method utilizing the device.


Find Patent Forward Citations

Garnier, Sébastien. (2019). Method and device for measuring path following under load (U.S. Patent No. 10408696). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10408696

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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