The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Jun. 22, 2017
Santec Corporation, Komaki, Aichi, JP;
Changho Chong, Los Altos, CA (US);
SANTEC CORPORATION, Komaki, JP;
Abstract
An OCT system includes a light source configured to generate an optical beam, a Fizeau-type interferometer configured to receive the optical beam and produce an interference pattern, a detector configured to receive the interference pattern and produce an image signal, and a processing circuit including a processor and a memory, the memory being structured to store instructions that are executable by the processor to cause the processor to receive the image signal from the detector and generate an OCT image based on the image signal. The Fizeau-type interferometer includes a scanning element configured to receive the optical beam and direct the optical beam in a plurality of directions towards a sample and a reflective element configured to divide the directed optical beam into a reference beam and a sample beam that reflects off of a surface of a sample.